Noise Temperature of an Electronic Tuner for Noise Parameter Measurement Systems

被引：0

作者：

Axelsson, Olle ^{[1
]}

Thorsell, Mattias ^{[1
]}

Andersson, Kristoffer ^{[1
]}

Stenarson, Jorgen ^{[2
]}

Rolain, Yves ^{[3
]}

机构：

[1] Chalmers, Microwave Elect Lab, S-41296 Gothenburg, Sweden

[2] SP Tech Res Inst Sweden, S-50115 Boras, Sweden

[3] Vrije Univ Brussel, Dept ELEC, B-B1050 Brussels, Belgium

来源：

2012 79TH ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG) | 2012年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, the noise temperature of an electronic tuner is determined and its significance for the suitability of such tuners in noise parameter measurement systems discussed. The noise temperature of the tuner was found to be higher than the ambient room temperature in the laboratory and vary significantly between tuner states. For impedance states with small input reflections coefficients, the excess noise temperature is around 25 K. For some of the states with higher reflection coefficients, this figure increases, reaching around 45 K at vertical bar Gamma vertical bar = 0.75. Unless accounted for, this leads to errors in noise parameter extraction when using an electronic tuner in noise parameter measurements.

引用

页数：2

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