Radiation-induced charge transfer inefficiency in Charge-Coupled Devices: Sentinel-4 CCD pre-development as a case study

被引:2
|
作者
Prod'homme, T. [1 ]
Belloir, J. -M. [1 ]
Weber, H. [1 ]
Courreges-Lacoste, G. Bazalgette [1 ]
Meynart, R. [1 ]
Nowicki-Bringuier, Y. -R. [1 ]
Caron, J. [1 ]
Levillain, Y. [1 ]
Woffinden, C. [2 ]
Lord, B. [2 ]
Mackie, R. [2 ]
机构
[1] European Space Agcy, ESTEC, NL-2200 AG Noordwijk, Netherlands
[2] E2v Technol UK Ltd, Chelmsford CM1 2QU, Essex, England
关键词
CCD; Radiation damage; CTI; Bulk traps; Sentinel; 4; Copernicus programme;
D O I
10.1117/12.2072625
中图分类号
TP7 [遥感技术];
学科分类号
081102 ; 0816 ; 081602 ; 083002 ; 1404 ;
摘要
Energetic particles in space damage electronic components, and in particular affect the capability of Charge-Coupled Devices (CCD) to transfer photo-generated charge packets to the output node. If not properly accounted for either during the instrument design process or in the mission data processing pipeline, radiation-induced Charge Transfer Inefficiency (CTI) causes image distortion, decreases the signal-to-noise ratio, and ultimately leads to bias in the measurement carried out. CTI is a well-identified error budget contributor for mission operating in the photon-starving regime like space telescopes dedicated to Astronomy, but is less studied in the context of Earth Observation missions. We present a study conducted during the Sentinel-4/UVN CCD pre-development to provide a first assessment of the CTI effects on the Sentinel-4 measurements.
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页数:16
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