Uncertainty Analysis in Waveform Metrology: from Vertical Measurement to Horizontal Quantities

被引：0

作者：

Zhang, Yichi ^{[1
]}

He, Zhao ^{[1
]}

Guo, Xiaotao ^{[1
]}

Yang, Aining ^{[1
]}

Wang, Lifeng ^{[1
]}

Nie, Meining ^{[1
]}

机构：

[1] Natl Inst Metrol, Beijing 100029, Peoples R China

来源：

2016 IEEE MTT-S INTERNATIONAL WIRELESS SYMPOSIUM (IWS) | 2016年

关键词：

Uncertainty analysis; waveform metrology; covariance matrix; Jacobian; GUM; Monte Carlo Method (MCM); PROPAGATION;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper investigates the covariance-matrix-based uncertainty propagation of waveforms from time-domain vertical measurements to horizontal parameters. Following the Guide to the Expression of Uncertainty in Measurement (GUM), the uncertainty of timebase, corresponding to target amplitude, of a measured waveform is evaluated upon the vertical measurement uncertainties, where the waveform function is used to determine the Jacobian matrix. As a result, the uncertainty of time-related parameters, such as the FWHM of impulse signal, of the waveform can be easily analyzed. To validate this work, Monte Carlo Method is implemented for comparison.

引用

页数：4

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