Slow crack growth and fracture toughness of sapphire for a window application

被引:4
|
作者
Salem, J [1 ]
Powers, L [1 ]
Allen, R [1 ]
Calomino, A [1 ]
机构
[1] NASA, Glenn Res Ctr, Life Predict Branch, Cleveland, OH 44135 USA
关键词
sapphire; fatigue; slow crack growth; reliability; strength; fracture toughness; life prediction; window;
D O I
10.1117/12.439192
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
The slow crack growth parameters, fracture toughness, and inert strength of the r- and a-planes of sapphire were measured in water in order to perform a life prediction on a pressurized sapphire window. The window is being considered for use in a combustion chamber on the International Space Station. Sapphire is relatively susceptible to stress corrosion in water despite a large strength in the absence of humidity. Two life prediction approaches were considered: a deterministic fracture mechanics approach and a Weibull based reliability approach. Preliminary results indicate that the window is feasible if a "short" finish is avoided. Fractography and additional predictions are being performed.
引用
收藏
页码:41 / 52
页数:12
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