Single-Event Latchup Measurements on COTS Electronic Devices for Use in ISS Payloads

被引：0
|
作者：
Irom, Farokh [1 ]
Allen, Gregory R. [1 ]
Vartanian, Sergeh [1 ]
机构：
[1] CALTECH, Jet Prop Lab, 4800 Oak Grove Dr, Pasadena, CA 91109 USA
来源：
2017 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW) | 2017年
基金：
美国国家航空航天局;
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper reports recent single-event latchup results for a variety of microelectronic devices that include an ADC, OpAmp, EEPROM, CPLD, PWM, transceiver, voltage regulator, digital signal processor, step-down converter, buck controller and supervisory circuits. The data were collected to evaluate these devices for possible use in NASA ISS payloads.
引用
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页码：1 / 6
页数：6
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