1 W plasma x-ray source for lithography at 1 nm wavelength

被引:5
|
作者
Turcu, ICE
Ross, IN
机构
[1] Rutherford Appleton Laboratory, Didcot
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 1996年 / 67卷 / 09期
关键词
D O I
10.1063/1.1147404
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A picosecond excimer laser-plasma source is used to generate average x-ray powers of 1.5 and 0.9 W at 1.4 and 1 nm wavelength, respectively. These wavelengths are required for proximity x-ray lithography in the semiconductor industry. The laser system uses a commercial KrF excimer amplifier for trains of 8 ps laser pulses which are focused to power densities of > 10(15) W/cm(2) on steel and copper tape targets, in atmospheric pressure helium gas. The laser to x-ray energy conversion efficiency is 10.4% at 1.4 nm and 5.4% at 1 nm x-ray wavelength. By using several, larger, commercial, excimer laser amplifiers, the x-ray power output of the laser-plasma source can be scaled up to the tens of watts required by the semiconductor industry. (C) 1996 American Institute of Physics.
引用
收藏
页码:3245 / 3247
页数:3
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