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- [7] EBSD Examination of Argon Ion Bombarded Ti-6Al-4V Samples Produced with DMLS Technology PERIODICA POLYTECHNICA-MECHANICAL ENGINEERING, 2019, 63 (03): : 195 - 200
- [10] The effects of gas composition on the ion milling of cross sectional TEM samples containing carbon layers SPECIMEN PREPARATION FOR TRANSMISSION ELECTRON MICROSCOPY OF MATERIALS IV, 1997, 480 : 137 - 148