Robust extrication method for line structured-light stripe

The center of the light stripe must be extricated accurately to implement 3D measurement with line structured-light. However, the intensity and shape of the light stripe may be different with surface changes of the object. It makes the setting of universal threshold very difficult. In this paper, a light stripe extrication method based symmetry is proposed. This method identifies the light stripe through analyzing the localized phase pattern obtained by wavelet transform. The contrast experiments results show that the proposed method which has a dimensionless property, is insensitive to the light stripe's changes and has a good performance against noise and scattering.