共 50 条
- [1] Radiation emission at channeling of electrons in a strained layer Si1-xGex undulator crystal [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2013, 309 : 37 - 44
- [3] Formation of crystalline Si1-xGex top layers by ion implantation in crystalline silicon [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2023, 538 : 17 - 23
- [4] Direct observation of lattice strain in Si1-xGex/Si crystals using planar channeling patterns [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 132 (01): : 177 - 187
- [5] ION CHANNELING ANALYSIS OF A SI1-XGEX(AS)/SI STRAINED LAYER [J]. APPLIED PHYSICS LETTERS, 1989, 54 (25) : 2571 - 2573
- [6] X-ray studies of Si1-xGex single crystals [J]. PHYSICS OF THE SOLID STATE, 2005, 47 (07) : 1225 - 1232
- [7] METASTABLE DEEP CENTERS IN SI1-XGEX SINGLE-CRYSTALS [J]. SEMICONDUCTORS, 1994, 28 (02) : 119 - 125
- [9] Channeling studies of relaxed, epitaxial Si1-xGex films [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1996, 108 (04): : 399 - 402
- [10] Alloy fluctuations in Si1-xGex crystals [J]. PHYSICA B-CONDENSED MATTER, 2001, 308 (308-310) : 558 - 560