Use of kernel (regression) based methods for sensor validation

被引：0

作者：

Usynin, A ^{[1
]}

Hines, JW ^{[1
]}

机构：

[1] Univ Tennessee, Dept Nucl Engn, Knoxville, TN 37996 USA

来源：

CDES '05: Proceedings of the 2005 International Conference on Computer Design | 2005年

关键词：

fault detection; kernel regression; performance metrics;

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Having the advantage of mathematical and intuitive simplicity,, kernel regression, is a widely used non-parametric technique. In this paper, a kernel regression-based approach to on-line, empirical sensor validation is investigated. Several metrics are used to assess the performance of the method in terms of its ability to detect and accommodate faulty measurements. An example application is provided to reveal the dependence of the performance metrics on the kernel bandwidth parameter.

引用

页码：233 / 239

页数：7

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