Laser-annealed, implanted boron emitters for B-BSF silicon solar cells

被引:0
|
作者
Paviet-Salomon, B. [1 ]
Lerat, J. F. [2 ]
Lanterne, A. [1 ]
Emeraud, T. [2 ]
Gall, S. [1 ]
Slaoui, A. [3 ]
机构
[1] CEA, LITEN, INES, 50 Ave Lac Leman, F-73377 Le Bourget Du Lac, France
[2] EXCICO Grp NV, B-3500 Hasselt, Belgium
[3] UDS, CNRS, UMR 7163, InESS, F-67037 Strasbourg, France
关键词
silicon; ion implantation; boron; laser thermal annealing; back-surface field; SATURATION CURRENT;
D O I
10.1016/j.egypro.2012.07.096
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Boron (B) emitters are required in an increasing number of silicon solar cells technologies, each of them requires an appropriate emitter profile. This work aims at investigating laser thermal annealing (LTA) from implanted B as a versatile approach for B-emitter processing compared to standard furnace annealing. Symmetrical p(+)/n/p(+) structures featuring various LTA B-emitters were characterized using the QssPC technique. Experimental results show that in contrast to thermally-diffused B-emitters, implied V-oc of LTA emitters increases when their sheet resistance decreases. Numerical simulations suggest that the observed trend could be attributed to a reduction in the surface recombination velocity. LTA emitters were then integrated as B-BSF into silicon solar cells. Gains of 2 mV in V-oc and 0.8 mA/cm(2) in J(sc) compared to Al-BSF were obtained, leading to an overall efficiency enhancement of 0.3 %(abs). (C) 2012 Published by Elsevier Ltd. Selection and peer-review under responsibility of the scientific committee of the SiliconPV 2012 conference.
引用
收藏
页码:474 / 479
页数:6
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