A three-dimensional calibration device for the confocal microscope

被引:10
|
作者
Jensen, K. E. [1 ]
Weitz, D. A. [1 ,2 ]
Spaepen, F. [2 ]
机构
[1] Harvard Univ, Dept Phys, Cambridge, MA 02138 USA
[2] Harvard Univ, Sch Engn & Appl Sci, Cambridge, MA 02138 USA
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2013年 / 84卷 / 01期
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.4776672
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Modern confocal microscopes enable high-precision measurement in three dimensions by collecting stacks of 2D (x-y) images that can be assembled digitally into a 3D image. It is difficult, however, to ensure position accuracy, particularly along the optical (z) axis where scanning is performed by a different physical mechanism than in x-y. We describe a simple device to calibrate simultaneously the x, y, and z pixel-to-micrometer conversion factors for a confocal microscope. By taking a known 2D pattern and positioning it at a precise angle with respect to the microscope axes, we created a 3D reference standard. The device is straightforward to construct and easy to use. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4776672]
引用
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页数:3
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