Dependence of 1/f Noise on the Distance Between Wires

被引:0
|
作者
Handel, Peter H. [1 ,2 ]
Avanaki, Kobra Nasiri [3 ]
机构
[1] Univ Missouri, Dept Phys & Astron, St Louis, MO 63121 USA
[2] Univ Missouri, Ctr Nanosci, St Louis, MO 63121 USA
[3] Univ Kansas, Dept Chem, Lawrence, KS 66045 USA
来源
2013 22ND INTERNATIONAL CONFERENCE ON NOISE AND FLUCTUATIONS (ICNF) | 2013年
关键词
Current fluctuations in nanostructures; 1/f noise; Quantum 1/f Effect; Quantum 1/f noise; Quantum Wires; ELECTRONIC DEVICES; PHASE NOISE;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper shows that in certain conditions fundamental 1/f noise in a semiconductor sample is increased by the presence of another similar current-carrying sample located in the close vicinity. This proximity effect is described by simple formulas derived here. The paper displays the connection between coherent and conventional quantum 1/f effect in terms of the s-parameter, i.e., the ratio between magnetic and kinetic energy of the carriers. On this basis the proximity effect is introduced for the first time. It is shown to be important in the transition region between coherent and conventional quantum 1/f effect. This is just the region corresponding to nano-scale structures and devices. Therefore, the new effect will be important in nanotechnology allowing for lower 1/f noise by splitting up the nano-wire into several thinner wires, or wells, with the same total cross section.
引用
收藏
页数:4
相关论文
共 50 条
  • [1] TEMPERATURE-DEPENDENCE OF 1/F NOISE
    EBERHARD, JW
    DUTTA, P
    HORN, PM
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1977, 22 (03): : 299 - 299
  • [2] ON THE FIELD-DEPENDENCE OF 1/F NOISE
    VANDEROER, TG
    PHYSICA B, 1991, 168 (01): : 53 - 57
  • [3] The temperature dependence of 1/f noise in InP
    Chen, XY
    Hooge, FN
    Leys, MR
    SOLID-STATE ELECTRONICS, 1997, 41 (09) : 1269 - 1275
  • [4] The fundamental 1/f noise and the hooge parameter in semiconductor quantum wires
    Balandin, A
    Wang, KL
    Svizhenko, A
    Bandyopadhyay, S
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1999, 46 (06) : 1240 - 1244
  • [5] TEMPERATURE-DEPENDENCE OF THE 1/F NOISE IN INSB
    ALEKPEROV, SA
    GUSEINOV, NY
    KADZHAR, CO
    SALAEV, EY
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1986, 20 (08): : 973 - 974
  • [6] Current dependence of 1/f noise in junction diodes
    Yang, Shiyuan
    Mizunami, Toru
    Takagi, Keiji
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1992, 31 (6 A): : 1752 - 1755
  • [7] ON GEOMETRICAL DEPENDENCE OF 1/F NOISE IN MOS TRANSISTORS
    KLAASSEN, FM
    PHILIPS RESEARCH REPORTS, 1970, 25 (03): : 171 - +
  • [8] TEMPERATURE-DEPENDENCE OF 1/F NOISE IN METALS
    YU, MK
    LIU, FS
    BAO, YN
    PHYSICAL REVIEW B, 1985, 32 (10) : 6394 - 6398
  • [9] ON THE GEOMETRICAL DEPENDENCE OF 1/F NOISE IN MOS TRANSISTORS
    KLAASSEN FM
    Philips Research Report, 1970, 25 (03): : 171 - 174
  • [10] CURRENT DEPENDENCE OF 1/F NOISE IN JUNCTION DIODES
    YANG, SY
    MIZUNAMI, T
    TAKAGI, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (6A): : 1752 - 1755