High-throughput photovoltaic cell characterization system

Photovoltaic technology will have a Substantial impact on the nation's wealth and economy in 21(st) Century. The main obstacle for widespread use of PV energy at present Is the higher cost of PV energy generation equipment compared to that of fossil fuels. Improved in-line diagnostics can reduce the cost and increase the productivity by significantly improving the yield of the process. Here we present the first results of development of a high-throughput PV (Photovoltaic) characterization system, which can provide fast and accurate data on the spatial uniformity of thickness, refractive indices, and birefringence of the thin films comprising the solar cell in a single scan over the entire solar cell area. The unmatched throughput, the amount of retrieved information, and the unique capability of characterization of both plane and structured surfaces and interfaces of such a system will provide the opportunity to use this system and develop in-situ, real time process diagnostics/prognostics capabilities that would result in improved yield and reduced cost of solar cell manufacturing. Here we provide the modeling results, demonstrate applicability of the technique for characterization of organic solar cells and discussing the modifications of the system that would permit characterization of structured solar cell surfaces.