Correction of spherical aberration for an electrostatic gridded lens

被引:2
|
作者
Pikin, Alexander [1 ]
Kponou, Ahovi [1 ]
机构
[1] Brookhaven Natl Lab, Upton, NY 11973 USA
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2008年 / 79卷 / 12期
关键词
aberrations; electrostatic lenses; ion beams; ray tracing;
D O I
10.1063/1.3030857
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Two methods to correct spherical aberration in electrostatic gridded lenses have been studied using ray-tracing simulations. Both methods are based on modifying the electrostatic field on the radial periphery of the lens. In the simplest case, the modification is done by extending the grid support axially. In the second method, the electric field on a radial periphery of the lens is modified by applying optimum voltage on an isolated correcting electrode. It is demonstrated that, for a given focal length, the voltage on this lens can be optimized for minimum aberration, and also that these lenses reduce the emittance growth of the ion beam.
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页数:4
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