The use of micro fourier-transform infrared spectroscopy and scanning electron microscopy with X-ray microanalysis for the identification of automobile paint chips

被引：0
|
作者：
ZiebaPalus, J
机构：
来源：
MIKROCHIMICA ACTA | 1997年
关键词：
forensic analysis; automobile paints; FT-IR microscopy; SEM-EDX;
D O I：
暂无
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
Infrared microspectroscopy (FT-IR microscopy) and electron scanning microscopy with energy-dispersive X-ray analysis (SEIM-EDX) have been applied for examination of multilayer fragments of automobile paints, for criminalistic purposes.
引用
收藏
页码：357 / 359
页数：3
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