The XPS investigation on the PC films irradiated by MeV C+n (n = 1-5) cluster ions (vol 243, pg 38, 2006)

被引：0

作者：

Dai, Junfeng

Zhao, Ziqiang ^{[1
]}

Zhai, Jin

Jiang, Lei

机构：

[1] Peking Univ, Inst Heavy Ion Phys, Beijing 100871, Peoples R China

[2] Minist Educ, Key Lab Heavy Ion Phys, Beijing 100871, Peoples R China

[3] Chinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2006年 / 246卷 / 02期

关键词：

D O I：

10.1016/j.nimb.2006.01.069

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：485 / 485

页数：1