Fabrication and Characterization of Temperature Insensitive 660-nm Resonant-Cavity LEDs

被引:5
|
作者
Chen, Jun-Rong [1 ,2 ]
Ko, Tsung-Shine [1 ,2 ]
Lu, Tien-Chang [1 ,2 ]
Chang, Yi-An [1 ,2 ]
Kuo, Hao-Chung [1 ,2 ]
Kuo, Yen-Kuang [3 ]
Tsai, Jui-Yen [4 ]
Laih, Li-Wen [4 ]
Wang, Shing-Chung [1 ,2 ]
机构
[1] Natl Chiao Tung Univ, Dept Photon, Hsinchu 30050, Taiwan
[2] Natl Chiao Tung Univ, Inst Electroopt Engn, Hsinchu 30050, Taiwan
[3] Natl Changhua Univ Educ, Dept Phys, Changhua 50058, Taiwan
[4] Millennium Commun Co Ltd, Hsinchu 303, Taiwan
关键词
Leakage current; modeling; polymethyl methacrylate plastic optic fiber (POF); resonant-cavity light-emitting diode (RCLED); semiconductor device;
D O I
10.1109/JLT.2008.920639
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
InGaP/AIGaInP 660-nm resonant-cavity light-emitting diodes (RCLEDs) with stable temperature characteristics have been achieved by extending the resonant cavity length from one optical wavelength (1 lambda) to three optical wavelengths (3 lambda) and tripling the number of quantum wells. When the operation temperature increases from 25 degrees C to 95 degrees C, the degree of power variation at 20 mA is reduced from -2.1 dB to -0.6 dB for the conventional 1-lambda cavity RCLEDs and 3-lambda cavity RCLEDs, respectively. In order to interpret the temperature-dependent experimental results, advanced device simulation is applied to model the RCLEDs with different cavity designs. According to the numerical simulation results, we deduce that the stable temperature-dependent output performance should originate from the reduction of electron leakage current and thermally enhanced hole transport for the 3-lambda cavity AIGaInP RCLEDs.
引用
收藏
页码:1891 / 1900
页数:10
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