Investigation on the Gaussian beam scattering from non-Gaussian random rough surface

被引:0
|
作者
Guo Li-Xin [1 ]
Ren Yu-Chao [1 ]
机构
[1] Xidian Univ, Sch Sci, Xian 710071, Peoples R China
关键词
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暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, Gamma function with different order K is introduced to characterize the pdf of rough surface. Using the unified full wave approach, the backscattering cross-sections of different polarizations are compared for the surfaces with Gamma and Gaussian distribution. Base on the previous investigation on the surface scattering with the plane wave incidence, this study extends to Gaussian beam fields excited by 2-D aperture field distributions, which is assumed incident upon a 2-D dielectric rough surface. It is shown that provided the linear dimension of the rough surface is large compared with the surface height correlation length, the results obtained will be close to those of the plane wave incidence.
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页码:2315 / 2317
页数:3
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