The application of digital holography for the inspection of microcomponents

被引:18
|
作者
Osten, W [1 ]
Seebacher, S [1 ]
Jüptner, W [1 ]
机构
[1] Bremen Inst Appl Beam Technol, BIAS, D-28359 Bremen, Germany
关键词
Digital Holography; direct phase measurement; multi-wavelengths contouring; microcomponent testing; materials parameters;
D O I
10.1117/12.445589
中图分类号
TH742 [显微镜];
学科分类号
摘要
Digital Holography is a modem coherent-optical technique that allows the direct acces to the interference phase in holographic interferometry. In contrast to conventional tactile measurement techniques digital holographic interferometry provides full-field access, non-invasivity, high sensitivity and accuracy, high resolution of data points and advanced system performance in order to meet requirements of the underlying numerical or analytical model. The measured interference phase contains the information about the shape of the object under test and/or its deformation after loading. These data can be used to investigate the materials' behaviour of microcomponents. In combination with special loading techniques and physical models of the loading behaviour of the investigated componets some important material parameters such as the Young's modulus, the Poisson ratio and the thermal expansion coefficient of microcomponents can be measured. The paper describes the measuring technology and shows some examples of microcomponent testing.
引用
收藏
页码:1 / 15
页数:15
相关论文
共 50 条
  • [1] The metrological basis for the inspection of microcomponents by Digital Holography
    Osten, W
    Seebacher, S
    Baumbach, T
    Jüptner, W
    TECHNISCHES MESSEN, 2001, 68 (02): : 68 - 79
  • [2] Digital holography and its application for microsystems inspection
    Werner Jüptner
    Christoph von Kopylow
    Claas Falldorf
    Optoelectronics Letters, 2008, (01) : 72 - 77
  • [3] Digital holography and its application for microsystems inspection
    Jueptner, Werner
    von Kopylow, Christoph
    Falldorf, Claas
    OPTOELECTRONICS LETTERS, 2008, 4 (01) : 2072 - 2077
  • [4] The determination of material parameters of microcomponents using digital holography
    Seebacher, S
    Osten, W
    Baumbach, T
    Jüptner, W
    OPTICS AND LASERS IN ENGINEERING, 2001, 36 (02) : 103 - 126
  • [5] A measurement system for the determination of material properties of microcomponents on the basis of digital holography
    Osten, W
    Seebacher, S
    Baumbach, T
    Jüptner, W
    TECHNISCHES MESSEN, 2001, 68 (02): : 80 - 85
  • [6] Absolute shape control of microcomponents using Digital Holography and multiwavelength-contouring
    Osten, W
    Seebacher, S
    Baumbach, T
    Jüptner, W
    METROLOGY-BASED CONTROL FOR MICRO-MANUFACTURING, 2001, 4275 : 71 - 84
  • [7] Digital holography and its application
    Zhang, YM
    Lü, QN
    Ge, BZ
    Zhao, HY
    Sun, YC
    HOLOGRAPHY, DIFFRACTIVE OPTICS, AND APPLICATIONS II, PTS 1 AND 2, 2005, 5636 : 200 - 211
  • [8] Application of digital holography to sprays
    Yang, Yan
    Kang, Bo-seon
    AD'07: PROCEEDINGS OF ASIA DISPLAY 2007, VOLS 1 AND 2, 2007, : 2050 - 2054
  • [9] Wavefront holoscopy: application of digital in-line holography for the inspection of engraved marks in progressive addition lenses
    Perucho, Beatriz
    Mico, Vicente
    JOURNAL OF BIOMEDICAL OPTICS, 2014, 19 (01)
  • [10] Glass bottle inspection by using digital in-line holography
    Buranasiri, Prathan
    Plaipichit, Suwan
    INTERFEROMETRY XVII: ADVANCED APPLICATIONS, 2014, 9204