Analysis of multiplicative speckle models for template-based SAR ATR

被引:33
|
作者
Kaplan, LM [1 ]
机构
[1] Clark Atlanta Univ, Dept Engn, Ctr Theoret Studies Phys Syst, Atlanta, GA 30314 USA
关键词
D O I
10.1109/7.976977
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
It has been noted that signal aperture radar (SAR) imagery of clutter exhibits Rayleigh multiplicative noise due to speckle. We use a database of MSTAR target chips to verify that the noise is multiplicative rather than additive for all regions in the chip. Then, by examining histograms corresponding to the noise residuals, we show that a Weibull distribution that is almost Rayleigh best fits the data. However, when we restrict the analysis over the target region, the log-normal and Rayleigh models fit the noise equally as well. This can be attributed to scattering mechanisms that are unstable over live degrees of aspect angle.
引用
收藏
页码:1424 / 1432
页数:9
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