VNA Tools II: S-parameter uncertainty calculation

被引:0
|
作者
Wollensack, Michael [1 ]
Hoffmann, Johannes [1 ]
Ruefenacht, Juerg [1 ]
Zeier, Markus [1 ]
机构
[1] METAS Swiss Fed Off Metrol, CH-3003 Bern, Switzerland
关键词
Vector Network Analyzer; S-parameters; Calibration; Uncertainty; Traceability;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper describes a software, METAS VNA Tools II, which is designed to compute uncertainties of coaxial S-parameter measurements. A bottom-up concept is used. Thus basic influence quantities are propagated through the calibration of the vector network analyzer to the S-parameters of a device under test. METAS UncLib is used for the linear propagation of uncertainties. The result is not only an uncertainty region but a list of uncertainty contributions with correlations. Thus the uncertainties can be propagated into eventual post-processing steps. In the present paper the concept has been verified by computing uncertainties of a calibration with a traditional quick short open load thru algorithm and an algorithm which involves optimization. The observed differences between the resulting uncertainties are lower than 0.3 percent, which can be explained by numerical inaccuracies.
引用
收藏
页数:5
相关论文
共 50 条
  • [1] Uncertainty of VNA S-parameter measurement due to nonideal TRL calibration items
    Stumper, U
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2005, 54 (02) : 676 - 679
  • [2] Influence of calibration uncertainties on VNA S-parameter measurements
    Stumper, U
    2002 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CONFERENCE DIGEST, 2002, : 132 - 133
  • [3] Uncertainty of VNA S-parameter measurement due to non-ideal TMSO or LMSO calibration standards
    Stumper, U.
    Advances in Radio Science, 2003, 1 : 1 - 8
  • [4] Influence of SOLT Calibration Standards on Multiport VNA S-Parameter Measurements
    Zhao, Wei
    Xiao, Jiankang
    Qin, Hongbo
    PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER, 2014, 144 : 303 - 318
  • [5] Characterizing Uncertainty in S-Parameter Measurements
    Buber, Tekamul
    Narang, Pragti
    Esposito, Giampiero
    Padmanabhan, Sathya
    Zeier, Markus
    MICROWAVE JOURNAL, 2019, 62 (10) : 88 - +
  • [6] Influence of TMSO calibration standards uncertainties on VNA S-parameter measurements
    Stumper, U
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2003, 52 (02) : 311 - 315
  • [7] Uncertainties of Multiport VNA S-Parameter Measurements Applying the GSOLT Calibration Method
    Zhao, Wei
    Yang, Xiaodong
    Xiao, Jiankang
    Abbasi, Qammer H.
    Qin, Hongbo
    Ren, Huorong
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2012, 61 (12) : 3251 - 3258
  • [8] Influence of nonideal LRL or TRL calibration elements on VNA S-parameter measurements
    Stumper, U.
    ADVANCES IN RADIO SCIENCE, 2005, 3 : 51 - 58
  • [9] Uncertainty Evaluation of Balanced S-Parameter Measurements
    Ziade, F.
    Hudlicka, M.
    Salter, M.
    Pavlicek, T.
    Allal, D.
    2016 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM 2016), 2016,
  • [10] Pulsed S-parameter measurements: on resolution, and uncertainty
    Martens, J.
    2013 IEEE INTERNATIONAL CONFERENCE ON MICROWAVES, COMMUNICATIONS, ANTENNAS AND ELECTRONICS SYSTEMS (IEEE COMCAS 2013), 2013,