Microstructural and optical investigations of Ce-doped barium titanate thin films by FTIR and spectroscopic ellipsometry

被引:18
|
作者
Mohamed, S. H. [1 ,2 ]
Dughaish, Z. H. [1 ]
机构
[1] Qassim Univ, Coll Sci, Dept Phys, Buryadh 51452, Saudi Arabia
[2] Sohag Univ, Fac Sci, Dept Phys, Sohag 82524, Egypt
关键词
Ce-doped barium titanate; FTIR; ellipsometric examination; CHEMICAL-VAPOR-DEPOSITION; BATIO3; LAYER;
D O I
10.1080/14786435.2011.642320
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
(BaTiO3)(1-x)(CeO2)(x) (with x = 0, 1, 3, 5.7 and 16 at.%) thin films were prepared by electron beam evaporation method. According to X-ray diffraction, nanosized and amorphous Ce-doped barium titanate thin films were obtained. The crystallinity diminished as Ce content increased. The increase in the Ce slightly shifts the absorption peaks at 433-450 and 416-424 cm(-1) to higher wavenumbers. A two-layer model was used to describe the experimental ellipsometric data. The Bruggeman effective medium approximation (BEMA) was used to describe the surface roughness layer and the Cauchy dispersion relation was used to describe the main Ce-doped barium titanate layer. The refractive index and the extinction coefficient were found to increase with increasing Ce content; however, the optical band gap decreased with increasing Ce content. The accurate determination of the optical constants of Ce-doped barium titanate thin films may favor them in the applications of optical thin film devices.
引用
收藏
页码:1212 / 1222
页数:11
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