Effect of surface roughness on microwave brightness temperature from lunar surface: Numerical analysis with a hybrid method

被引:14
|
作者
He, Linfeng [1 ]
Lang, Liang [1 ]
Li, Qingxia [1 ]
Zheng, Wenchao [1 ]
机构
[1] Huazhong Univ Sci & Technol, Dept Elect & Informat Engn, Sci & Technol Multispectral Informat Proc Lab, Wuhan 430074, Peoples R China
基金
国家高技术研究发展计划(863计划); 中国国家自然科学基金;
关键词
Brightness temperature; Multilayered media; Rough surface; Method of moments; GRID METHOD; SCATTERING; REGOLITH; EMISSION; TOPOGRAPHY; SCALE; MOON; PARAMETERIZATION; SIMULATIONS; KIRCHHOFF;
D O I
10.1016/j.asr.2012.09.027
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
A hybrid method, combining the radiative transfer theory and the method of moments (MoM), is proposed to study the potential effect of the lunar surface roughness on the microwave brightness temperature. The total upward emission reaching the lunar surface from below media is calculated by the radiative transfer theory, and then the brightness temperature is obtained by weighting the bidirectional transmission coefficients which is computed using the MoM. The method is validated by both flat and rough surface models with analytic solutions. With the hybrid method, brightness temperatures from simulated lunar model are calculated and compared to those from a flat layered model. The comparisons show that the effect of rough surface on brightness temperature cannot be ignored and also depends on many other factors, such as observation angle and polarizations. For vertical polarization, an optimal observation angle may exist to reduce the effect of surface roughness. These results indicate that the knowledge of lunar surface roughness is important in microwave remote sensing to the Moon and may probably provide a guide to lunar projects in future. (C) 2012 COSPAR. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:179 / 187
页数:9
相关论文
共 50 条
  • [1] EFFECT OF SURFACE-ROUGHNESS ON MICROWAVE BRIGHTNESS TEMPERATURE OF SOILS
    CHOUDHURY, BJ
    SCHMUGGE, TJ
    CHANG, A
    TRANSACTIONS-AMERICAN GEOPHYSICAL UNION, 1976, 57 (12): : 920 - 920
  • [2] Microwave Brightness Temperature of the Moon: The Possibility of Setting a Calibration Source of the Lunar Surface
    Hu, Guo-Ping
    Zheng, Yong-Chun
    Xu, Ao-Ao
    Tang, Ze-Sheng
    IEEE GEOSCIENCE AND REMOTE SENSING LETTERS, 2016, 13 (02) : 182 - 186
  • [3] Simulations on the influence of lunar surface temperature profiles on CE-1 lunar microwave sounder brightness temperature
    Li Yun
    Wang ZhenZhan
    Jiang JingShan
    SCIENCE CHINA-EARTH SCIENCES, 2010, 53 (09) : 1379 - 1391
  • [4] Simulations on the influence of lunar surface temperature profiles on CE-1 lunar microwave sounder brightness temperature
    LI Yun1
    2 Graduate University of Chinese Academy of Sciences
    ScienceChina(EarthSciences), 2010, 53 (09) : 1379 - 1391
  • [5] Simulations on the influence of lunar surface temperature profiles on CE-1 lunar microwave sounder brightness temperature
    Yun Li
    ZhenZhan Wang
    JingShan Jiang
    Science China Earth Sciences, 2010, 53 : 1379 - 1391
  • [6] Microwave brightness temperature of cratered lunar surface and inversions of the physical temperature profile and thickness of regolith layer
    Gong, Xiaohui
    Jin, Ya-Qiu
    RADIO SCIENCE, 2012, 47
  • [7] Numerical simulation of the temperature of lunar surface
    Cheng, Ke
    Zhang, He-Fei
    Yuhang Xuebao/Journal of Astronautics, 2007, 28 (05): : 1376 - 1380
  • [8] LUNAR SURFACE ROUGHNESS FROM CRATER STATISTICS
    MCGILLEM, CD
    MILLER, BP
    JOURNAL OF GEOPHYSICAL RESEARCH, 1962, 67 (12): : 4787 - &
  • [9] Lunar surface roughness based on multiscale morphological method
    Cao, Wei
    Cai, Zhanchuan
    Tang, Zesheng
    PLANETARY AND SPACE SCIENCE, 2015, 108 : 13 - 23
  • [10] Analysis of the brightness temperature features of the lunar surface using 37 GHz channel data from the Chang'E-2 microwave radiometer
    Zhu, Yongchao
    Zheng, Yongchun
    Fang, Shibo
    Zou, Yongliao
    Pearson, Simon
    ADVANCES IN SPACE RESEARCH, 2019, 63 (01) : 750 - 765