Guest Editors' Introduction: Selected Papers from IEEE VLSI Test Symposium

被引：0

作者：

Carlo, Stefano Di ^{[1
]}

Song, Peilin ^{[2
]}

Chickermane, Vivek ^{[3
]}

机构：

[1] Politecn Torino, Dept Automat & Comp Sci, Turin, Italy

[2] IBMs TJ Watson Res Ctr, Yorktown Hts, NY USA

[3] Cadence Design Syst, Endicott, NY 13760 USA

来源：

IEEE DESIGN & TEST | 2020年 / 37卷 / 04期

关键词：

D O I：

10.1109/MDAT.2020.2998440

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：5 / 6

页数：2

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