A Model Driven Testing Environment for Embedded Software

被引:0
|
作者
Yang Shunkun [1 ]
Fu Jianping [1 ]
机构
[1] Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R China
关键词
Hardware-in-the-loop (HIL); real-time simulation (RTS); automated software testing; test environment; software system testing; test model;
D O I
10.1117/12.2010912
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper presents a hardware-in-loop (HIL) real-time simulation environment for embedded software testing, namely the Embedded Software Simulation Test Environment (ESSTE). We give a detailed description of methods, architecture and critical components of ESSTE. For validation purposes, the proposed real-time HIL testing approach and ESSTE is applied in experiments and some application examples. Experiment results show that the test environment employed in this paper can be applied to systems in practice. And different domain of applications approved that the proposed ESSTE can go far forward to improve the reliability and quality of the embedded software.
引用
收藏
页数:7
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