Advanced Magnetic Force Microscopy for High Resolution Magnetic Imaging

被引：3
|
作者：
Ranjbar, M. [1 ,2 ]
Piramanayagam, S. N. [1 ]
Sbiaa, R. [1 ]
Chong, T. C. [1 ,2 ]
Okamoto, I. [3 ]
机构：
[1] ASTAR, Data Storage Inst, Singapore 117608, Singapore
[2] Natl Univ Singapore, Elect & Comp Engn Dept, Singapore 117576, Singapore
[3] Western Digital, Singapore 638552, Singapore
来源：
NANOSCIENCE AND NANOTECHNOLOGY LETTERS | 2012年 / 4卷 / 06期
关键词：
Magnetic Force Microscopy; Perpendicular Magnetic Anisotropy; Antiferromagnetic Coupling; TIPS;
D O I：
10.1166/nnl.2012.1367
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Magnetic force microscopy (MFM) is one of the primary imaging tools for studying magnetic nanostructures. The resolution of MFM has been considered as a main issue in characterizing magnetic nanostructures smaller than 30 nm; especially for high density recording media beyond 1 Tbit/in(2). In this letter, we investigated three different kinds of MFM tips such as those with a perpendicular magnetic anisotropy (PMA) derived from a crystallographic texture, antiferromagnetic coupled perpendicular (AFC) tips and tips with no crystallographic textures, resulting in no PMA. Their resolution, as measured using a recording media with written information, was compared with that of commercial MFM tips. The tip in the PMA configuration was found to provide the best resolution among all of them.
引用
收藏
页码：628 / 633
页数：6
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