Electron backscatter diffraction and orientation imaging microscopy

被引：3
|
作者：
Dingley, DJ [1 ]
Field, DP [1 ]
机构：
[1] TEXSEM LABS,PROVO,UT
来源：
MATERIALS SCIENCE AND TECHNOLOGY | 1997年 / 13卷 / 01期
关键词：
BACK-SCATTER DIFFRACTION; PATTERNS; DEFORMATION;
D O I：
10.1179/mst.1997.13.1.69
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
An overview of electron backscatter diffraction is presented in which experimental procedures are reviewed together with a basic theoretical description of the mechanism of pattern generation. Manual and automated indexing procedures are described. The new technique of orientation imaging microscopy is presented, with examples from recrystallised Al-Mg alloy, deformed superplastic material, and fractured nickel base alloy.
引用
收藏
页码：69 / 78
页数：10
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