Cu6Sn5 precipitation during Sn-based solder/Cu joint solidification and its effects on the growth of interfacial intermetallic compounds

被引:64
|
作者
Yang, Ming [1 ]
Cao, Yong [1 ]
Joo, Sungmin [1 ,2 ]
Chen, Hongtao [1 ]
Ma, Xin [3 ]
Li, Mingyu [1 ]
机构
[1] Harbin Inst Technol, Shenzhen Key Lab Adv Mat, Shenzhen Grad Sch, Shenzhen 518055, Peoples R China
[2] Res Inst Ind Sci & Technol, Plant R&D Div, Ulsan 683420, South Korea
[3] Yik Shing Tat Ind Co Ltd, Shenzhen 518101, Peoples R China
关键词
Lead-free solder; Cu6Sn5; Precipitation; Crystal growth; Intermetallics; LEAD-FREE SOLDER; MECHANICAL-PROPERTIES; PHASE-STABILITY; IMC GROWTH; AG; ALLOYS; RELIABILITY; DISSOLUTION; TRANSITION; MORPHOLOGY;
D O I
10.1016/j.jallcom.2013.08.013
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A study was performed on the precipitation behavior of Cu6Sn5 during the solidification of Sn-based solders/Cu joints and its effect on the growth of interfacial intermetallic compounds (IMCs). During cooling, Cu in molten solder precipitates in the form of Cu6Sn5 both within the solder matrix and at the interface. The precipitation at the interface can greatly affect the interfacial IMC morphology and thickness but cannot change the interfacial IMC orientation. In general, additional Cu6Sn5 will precipitate at the solder/Cu interface when the Cu content is increased in the molten solder during soldering and when the cooling rate decreases during solder solidification. If the Cu content in the molten solder is sufficiently high, during cooling, the precipitated Cu6Sn5 will develop a prismatic morphology with the exposed surface indexed as (10-10) along the [0 0 0 1] direction of the existing Cu6Sn5 grains at the interface. (c) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:688 / 695
页数:8
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