Scanning probe charge reading of ferroelectric domains

被引：9

作者：

Kim, Byong M. ^{[1
]}

Adams, Donald E. ^{[1
]}

Tran, Quan ^{[2
]}

Ma, Qing ^{[2
]}

Rao, Valluri ^{[2
]}

机构：

[1] Nanochip Inc, Fremont, CA 94538 USA

[2] Intel Corp, Components Res, Santa Clara, CA 95052 USA

来源：

APPLIED PHYSICS LETTERS | 2009年 / 94卷 / 06期

关键词：

dielectric polarisation; electric domains; ferroelectric thin films; lead compounds; piezoelectric thin films; piezoelectricity; MICROSCOPY;

D O I：

10.1063/1.3081020

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A scanning probe charge-detection technique based on direct piezoelectric effect is demonstrated to read alternating bit polarizations in a ferroelectric media The bit signal is generated by spatially modulating charges interacting with a probe tip scanning in contact with the media. A periodicity of the bits is used with an appropriate scan speed to modulate the signal frequency. A signal-to-noise ratio of 10 dB has been achieved for a contact force of 100 nN. The modulation of the bit signal frequency into the 2 kHz data rate is achieved by coupling 0.4 mu m spacing between alternating polarizations with scanning speed of 1.6 mm/s.

引用

页数：3

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