共 50 条
- [1] Characterization of ferroelectric ceramics using x-ray diffraction, transmission electron microscopy, and x-ray photoelectron spectroscopy SMART MATERIALS & STRUCTURES, 2003, 12 (04): : 565 - 570
- [2] Microporosity and nanostructure of activated carbons: characterization by X-ray diffraction and scattering, Raman spectroscopy and transmission electron microscopy ADSORPTION-JOURNAL OF THE INTERNATIONAL ADSORPTION SOCIETY, 2023, 29 (5-6): : 275 - 289
- [5] Reoxidation of silicon nitride studied using x-ray photoelectron spectroscopy and transmission electron microscopy Gilmore, D. (damien.gilmore@onsemi.com), 1600, American Institute of Physics Inc. (95):
- [8] Characterization of SbSI nanocrystals by electron microscopy, X-ray diffraction and Raman scattering JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2003, 5 (03): : 713 - 718