The fracture of nanoporous methylsilsesquioxane thin-film glasses in moist air and aqueous solutions was investigated. We demonstrate the effects of controlled volume fractions of nanometer sized pores on the films resistance to fracture. Subcritical cracking accelerated by the presence of moisture, controlled pH, and hydrogen peroxide solutions is reported. Surprising changes in the near threshold growth rate behavior were observed for buffered solutions. We demonstrate that these changes are related to the unexpected diffusion of the aqueous solutions into the highly hydrophobic films. The presence of the solution changes the surface stress of the internal pore surfaces, which changes the stress state of the film. The change in film stress surrounding the crack alters the crack driving force and has profound effects on the resulting crack-growth threshold behavior.
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Department of Materials Science and Engineering, Stanford University, Stanford
Exponent Failure Analysis Associates, Menlo ParkDepartment of Materials Science and Engineering, Stanford University, Stanford
Guyer E.P.
Patz M.
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Tsukuba Research Laboratory, JSR Corporation, TsukubaDepartment of Materials Science and Engineering, Stanford University, Stanford
Patz M.
Dauskardt R.H.
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Department of Materials Science and Engineering, Stanford University, StanfordDepartment of Materials Science and Engineering, Stanford University, Stanford
机构:
Department of Materials Science and Engineering, Stanford University, Stanford
Exponent Failure Analysis Associates, Menlo ParkDepartment of Materials Science and Engineering, Stanford University, Stanford
Guyer E.P.
Gantz J.
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Department of Materials Science and Engineering, Stanford University, Stanford
Swiss Federal Institute of Technology, LausanneDepartment of Materials Science and Engineering, Stanford University, Stanford
Gantz J.
Dauskardt R.H.
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Department of Materials Science and Engineering, Stanford University, StanfordDepartment of Materials Science and Engineering, Stanford University, Stanford
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Xerox Res Ctr Canada Ltd, Mat Design & Integrat Lab, Mississauga, ON L5K 2L1, CanadaXerox Res Ctr Canada Ltd, Mat Design & Integrat Lab, Mississauga, ON L5K 2L1, Canada
Wu, Yiliang
Liu, Ping
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Xerox Res Ctr Canada Ltd, Mat Design & Integrat Lab, Mississauga, ON L5K 2L1, CanadaXerox Res Ctr Canada Ltd, Mat Design & Integrat Lab, Mississauga, ON L5K 2L1, Canada
Liu, Ping
Ong, Beng S.
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Xerox Res Ctr Canada Ltd, Mat Design & Integrat Lab, Mississauga, ON L5K 2L1, CanadaXerox Res Ctr Canada Ltd, Mat Design & Integrat Lab, Mississauga, ON L5K 2L1, Canada