Nuclear Magnetic Resonance and X-ray Reflectometry of Co/Cu Superlattices

被引:3
|
作者
Chuprakov, S. A. [1 ]
Bannikova, N. S. [1 ]
Blinov, I. V. [1 ]
Krinitsina, T. P. [1 ]
Milyaev, M. A. [1 ]
Popov, V. V. [1 ]
Ustinov, V. V. [1 ]
机构
[1] RAS, Ural Branch, MN Miheev Inst Met Phys, S Kovalevskaya Str 18, Ekaterinburg 620108, Russia
关键词
GIANT MAGNETORESISTANCE; INTERFACE STRUCTURE; MULTILAYERS; NMR;
D O I
10.1007/s00723-018-1090-2
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
The state of interfaces in Co/Cu superlattices with various thicknesses of non-magnetic Cu layers (t(cu)) has been studied by the methods of nuclear magnetic resonance (NMR)and X-ray reflectometry. The samples glass/Fe(5nm)/[Co(1.5nm)/Cu(t(cu))](10)/Cr(3nm) were fabricated by the method of magnetron sputtering on glass substrates under constant current in the ULVAC MPS-4000-C6 device. The Co-59 NMR spectra were taken in a local magnetic field in the frequency range of 90-240MHz at 4.2K in the pulsed NMR spectrometer. The spin echo signal was formed by a sequence of two coherent radio-frequency pulses ((p))(x)-t(del)-((p))(y)-t(del)-echo forming an alternate magnetic field with the round component amplitude H-1 of about 10 Oe in a resonance coil. It has been shown both by NMR and X-ray reflectometry that the structure of interfaces deteriorates with an increase of the Cu layers thickness, and similar dependences of the parameters characterizing structural imperfection of interfaces were obtained by these two methods.
引用
收藏
页码:415 / 423
页数:9
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