Decoupling of geometric thickness and refractive index in quantitative phase microscopy

被引：20
|
作者：
Cardenas, Nelson [1 ]
Mohanty, Samarendra [1 ]
机构：
[1] Univ Texas Arlington, Dept Phys, Biophys & Physiol Lab, Arlington, TX 76019 USA
来源：
OPTICS LETTERS | 2013年 / 38卷 / 06期
关键词：
CONTRAST; COMPENSATION; DYNAMICS; LIQUIDS;
D O I：
10.1364/OL.38.001007
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
In quantitative phase imaging, a priori knowledge of either refractive index or physical thickness is used to estimate the change in one of these parameters. Here, we report a method for decoupling geometric thickness from refractive index in quantitative phase microscopy. (C) 2013 Optical Society of America
引用
收藏
页码：1007 / 1009
页数：3
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