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- [4] Electromigration of Sn-3Ag-0.5Cu and Sn-3Ag-0.5Cu-0.5Ce-0.2Zn solder joints with Au/Ni(P)/Cu and Ag/Cu pads Journal of Alloys and Compounds, 2009, 487 (1-2): : 458 - 465
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- [9] Electromigration reliability of Sn–3.0Ag–0.5Cu/Cu–Zn solder joints Journal of Materials Science: Materials in Electronics, 2019, 30 : 7645 - 7653
- [10] Electromigration behavior of Cu/Sn3.0Ag0.5Cu/Cu ball grid array solder joints Journal of Materials Science: Materials in Electronics, 2019, 30 : 6224 - 6233