Delay fault diagnosis for non-robust test

With feature sizes steadily shrinking, manufacturing defects and parameter variations often cause design timing failures. It is essential that those errors be correctly and quickly diagnosed. The existing delay-fault diagnosis algorithms cannot identify the delay faults that require non-robust tests, because they ignore non-robust propagation conditions while emulating the failure analyzer behavior. We propose a novel approach to perform delay-fault diagnosis for robust and non-robust tests. The experimental results show that our approach can diagnose delay faults with good resolution. It is stable with respect to delay variations that the failure analyzer might experience.