Optimal replacement of an item subject to cumulative damage under periodic inspections

被引:19
|
作者
Kong, MB [1 ]
Park, KS [1 ]
机构
[1] KOREA ADV INST SCI & TECHNOL,TAEJON 305701,SOUTH KOREA
来源
MICROELECTRONICS AND RELIABILITY | 1997年 / 37卷 / 03期
关键词
D O I
10.1016/0026-2714(95)00212-X
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An item undergoes cumulative damage through use. The item fails randomly but the failure rate depends on the accumulated damage. The item is preventively replaced if it survives a certain damage limit at periodic inspections; on failure, it is replaced immediately. The optimal damage limit for preventive replacement which minimizes the long-run expected cost rate is derived. It is unique if an item has increasing damage-dependent failure rate. Numerical example for a stationary gamma process with Weibull distributed failure is given. Copyright (C) 1996 Elsevier Science Ltd.
引用
收藏
页码:467 / 472
页数:6
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