Crystallization, microstructures and properties of low temperature co-fired CaO-Al2O3-SiO2 glass-ceramic

被引:6
|
作者
Li, Bo [1 ,2 ,3 ]
Qing, Zhenjun [1 ]
Li, Yingxiang [1 ]
Li, Hao [1 ]
Zhang, Shuren [1 ,2 ,3 ]
机构
[1] Univ Elect Sci & Technol China, Sch Microelect & Solid State Elect, Chengdu 610054, Peoples R China
[2] State Key Lab Elect Thin Films & Integrated Devic, Chengdu 610054, Peoples R China
[3] Natl Engn Res Ctr Electromagnet Radiat Control Ma, Chengdu 610054, Peoples R China
关键词
Crystallization; Glass-ceramic; Thermal expansion; Sintering; LTCC; DIELECTRIC-PROPERTIES; SINTERING BEHAVIOR; LTCC APPLICATIONS;
D O I
10.1007/s10832-016-0048-8
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
CaO-Al2O3-SiO2 glass-ceramic were prepared by melt quenching technique. The crystallization behavior and properties were studied by means of a non-isothermal, thermal analysis technique, X-ray diffraction and scanning electron microscopy. The influence of sintering temperature on phase formation, microstructure, bending strength, dielectric and thermal properties were determined. The activation energy of crystallization and the Avrami parameter were also discussed. The X-ray diffraction results show that SiO2 phase could be found in all samples and CaSiO3 and anorthite phases could only be observed in the samples sintered at above 875A degrees C. The densification of glass-ceramic starts at 730A degrees C after the liquid glass is formed and stops at 803A degrees C. Complete densification was achieved at 875A degrees C and the highest mechanical strength was obtained at 850A degrees C, but density significantly decreased at higher temperatures. The coefficient of thermal expansion and the dielectric constant increase with the increasing sintering temperature. The value of the Avrami parameter (n) is similar to 1.6 and the apparent activation energy (E) is 298 kJ/mol.
引用
收藏
页码:145 / 150
页数:6
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