Electron-Ion Collision Studies with Highly Charged Sulfur Ions

被引：0
|
作者：
Ali, S. [1 ]
Mahmood, S. [1 ]
Orban, I. [1 ]
Tashenov, S. [1 ]
Li, Y. M. [2 ]
Wu, Z. [2 ]
Schuch, R. [1 ]
机构：
[1] Stockholm Univ, Albanova Univ Ctr, Dept Phys, S-10691 Stockholm, Sweden
[2] Inst Appl Phys & Computat Math, Beijing 100088, Peoples R China
来源：
XXVII INTERNATIONAL CONFERENCE ON PHOTONIC, ELECTRONIC AND ATOMIC COLLISIONS (ICPEAC 2011), PTS 1-15 | 2012年 / 388卷
关键词：
D O I：
10.1088/1742-6596/388/6/062046
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
We have obtained dielectronic recombination (DR) cross sections for H-like and He-like S, using the Stockholm Refrigerated Electron Beam Ion Trap (R-EBIT). The experimental results are compared with a calculation for the resonance positions and strengths and show good agreement within the error bars, but also deviations in some cases.
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