Influence of substrate holder configurations on bias enhanced nucleation area for diamond heteroepitaxy: Toward wafer-scale single-crystalline diamond synthesis

被引:15
|
作者
Yoshikawa, Taro [1 ]
Herrling, David [1 ]
Meyer, Frank [2 ]
Burmeister, Frank [2 ]
Nebel, Christoph E. [1 ]
Ambacher, Oliver [1 ,3 ]
Lebedev, Vadim [1 ]
机构
[1] Fraunhofer Inst Appl Solid State Phys IAF, Tullastr 72, D-79108 Freiburg, Germany
[2] Fraunhofer Inst Mech Mat IWM, Woehlerstr 11, D-79108 Freiburg, Germany
[3] Albert Ludwigs Univ Freiburg, Inst Sustainable Syst Engn INATECH, Emmy Noether Str 2, D-79110 Freiburg, Germany
来源
关键词
GROWTH; IRIDIUM; FILMS; TRANSPOLYACETYLENE; DEPOSITION; DENSITY; SILICON; FIELD;
D O I
10.1116/1.5086020
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A simple and effective method to extend the area of bias enhanced nucleation (BEN) for heteroepitaxial diamond growth is introduced. Two-inch substrates are placed on a flat and smooth surface of approximately 3-in. Mo substrate holder and then treated via BEN with or without metal-covered Si plates located right outside of the substrates. It is clarified that not only the plates themselves but also their thickness has a great impact on the BEN area, or in other words, the homogeneity of nucleation density on the substrates. As a result, the epitaxial diamond nucleation is successfully performed on nearly the whole area of a 2-in. Ir/YSZ/Si(001) substrate using the 1 mm thick halfring plates. For a proof of this concept, finite element method simulations are also performed to investigate the influence of such plates on plasma (electron) density distributions above the substrates. Throughout this study, the significance of substrate holder configurations for the widely accessible wafer-scale diamond heteroepitaxy is revealed. Published by the AVS.
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页数:8
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