NASA Goddard Space Flight Center's Recent Radiation Effects Test Results

被引：1
|
作者：
Topper, Alyson D. [1 ,2 ]
O'Bryan, Martha V. [1 ,2 ]
Wilcox, Edward P. [2 ]
Carstens, Thomas A. [2 ]
Barth, Jonathan D. [2 ]
Berg, Melanie [1 ,2 ]
Casey, Megan C. [2 ]
Joplin, Matthew B. [2 ]
Lauenstein, Jean-Marie [2 ]
Campola, Michael J. [2 ]
Cochran, Donna J. [1 ,2 ]
Pellish, Jonathan A. [2 ]
Majewicz, Peter J. [2 ]
机构：
[1] SSAI, Lanham, MD 20706 USA
[2] NASA, Goddard Space Flight Ctr, Code 561-4, Greenbelt, MD 20771 USA
来源：
2022 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW) (IN CONJUNCTION WITH 2022 NSREC) | 2022年
关键词：
D O I：
10.1109/REDW56037.2022.9921535
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FPGAs, optoelectronics, digital, analog, and bipolar devices.
引用
收藏
页码：117 / 123
页数：7
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