Fast Near-Field Characterization of Integrated Circuits Electromagnetic Interference

被引：0
|
作者：
Harwot, Ondrej [1 ]
机构：
[1] Czech Tech Univ, Dept Microelect, Tech 2, Prague 16627, Czech Republic
来源：
PROCEEDINGS OF THE 21ST INTERNATIONAL CONFERENCE - RADIOELEKTRONIKA 2011 | 2011年
关键词：
Near-Field Scanning; IC; EMC; IEC; 61967; Magnetic Field Probe;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper describes method for speed improvement of electromagnetic near-field scanning. Using the technique described in this paper both high spatial resolution and high speed of measurement can be achieved Some applications of near-field scanning are presented and discussed Near-field scan technique is used for measurement of magnetic field distribution above a passive structure and for analysis of electromagnetic emission of integrated circuit operating in different regimes. Results show good reliability of presented method and its effectiveness for investigation of electromagnetic interference in integrated structures.
引用
收藏
页码：311 / 314
页数：4
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