High-resolution spectral hole burning in InGaAs-GaAs quantum dots

被引:22
|
作者
Berry, JJ [1 ]
Stevens, MJ [1 ]
Mirin, RP [1 ]
Silverman, KL [1 ]
机构
[1] Natl Inst Stand & Technol, Div Optoelect, Boulder, CO 80305 USA
关键词
11;
D O I
10.1063/1.2172291
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report the use of continuous wave spectral hole burning to perform high-resolution spectroscopy of the homogeneous linewidth of self-assembled InGaAs-GaAs quantum dots at low temperature. We use this technique to examine the power broadening behavior of the homogeneous InGaAs-GaAs quantum dot line. We find that at a temperature of 9.8 K and over the majority of the pump powers considered, the spectral hole signal is well fit by a single Lorentizian line shape. Analysis of the power broadening yields a full width at half maximum of 0.74 mu eV for the homogeneous linewidth and a corresponding coherence time T-2 of 1.76 ns.
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页数:3
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