Investigation of responsivity decreasing with rising bias voltage in a GaN Schottky barrier photodetector

被引:3
|
作者
Zhang, Shuang [1 ]
Zhao, D. G. [1 ]
Jiang, D. S. [1 ]
Liu, W. B. [1 ]
Duan, L. H. [1 ]
Wang, Y. T. [1 ]
Zhu, J. J. [1 ]
Liu, Z. S. [1 ]
Zhang, S. M. [1 ]
Yang, Hui [1 ]
机构
[1] Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
基金
中国国家自然科学基金;
关键词
D O I
10.1088/0268-1242/23/10/105015
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The unexpected decrease in measured responsivity observed in a specific GaN Schottky barrier photodetector (PD) at high reverse bias voltage was investigated and explained. Device equivalent transforms and small signal analysis were performed to analyse the test circuit. On this basis, a model was built which explained the responsivity decrease quantitatively. After being revised by this model, responsivity curves varying with bias voltage turned out to be reasonable. It is proved that the decrease is related to the dynamic parallel resistance of the photodiode. The results indicate that with a GaN Schottky PD, the choice of load resistance is restricted according to the dynamic parallel resistance of the device to avoid responsivity decay at high bias voltage.
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收藏
页数:6
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