Stigmatic X-ray imaging using a single spherical Laue crystal

被引:1
|
作者
del Rio, M. Sanchez [1 ]
Bianchi, D. [2 ]
Pikuz, T. A. [4 ]
Faenov, A. Ya [3 ,4 ]
Pikuz, S. A., Jr. [4 ]
Delgado-Aparicio, L. [5 ]
Pablant, N. [5 ]
Bitter, M. [5 ]
Hill, K. [5 ]
机构
[1] European Synchrotron Radiat Facil, BP 220, F-38043 Grenoble, France
[2] Vienna Univ Technol, A-1040 Vienna, Austria
[3] Japan Atom Energy Agcy, Quantum Beam Sci Directorate, Kyoto, Kizugawa 6190215, Japan
[4] Russian Acad Sci, Joint Inst High Temp, Moscow 125412, Russia
[5] Princeton Plasma Phys Lab, Princeton, NJ 08543 USA
关键词
OPTICS;
D O I
10.1088/1742-6596/425/19/192021
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We propose a crystal configuration using a single Laue spherical crystal for imaging applications. A crystal in Laue geometry set to focus a divergent beam in the meridional (diffraction) plane, but does not focus in the sagittal plane. A transmission object placed in the beam is imaged with different horizontal and vertical aspect ratio, but it is possible to find a configuration with similar aspect ratio. This system is studied using ray tracing, which permit to reproduce preliminary experimental data [1]. The concept of a stigmatic focusing by a single optical element may have applications in imaging, like in transmission microscopy or for hard X-ray backlighting and self-imaging in high energy density plasma experiments. Inertial confinement fusion experiments and large tokamak projects such as ITER may benefit from this optical configuration.
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页数:4
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