Detecting Intermittent Resistive Faults in Digital CMOS Circuits

被引：0

作者：

Ebrahimi, Hassan ^{[1
]}

Rohani, Alireza ^{[1
]}

Kerkhoff, Hans G. ^{[1
]}

机构：

[1] Univ Twente, Ctr Telemat & Informat Technol, Testable Design & Test Integrated Syst TDT Grp, Enschede, Netherlands

来源：

2016 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT) | 2016年

关键词：

Dependability; Reliability; No Faults Found; Intermittent Resistive Faults; Intermittent Fault Detection; EFFICIENT;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Interconnection reliability threats dependability of highly critical electronic systems. One of most challenging interconnection-induced reliability threats are intermittent resistive faults (IRFs). The occurrence rate of this kind of defects can take e.g. one month, and the duration of defects can be as short as a few nanoseconds. As a result, evoking and detecting these faults is a big challenge. IRFs can cause timing deviations in data paths in digital systems during its operating time. This paper proposes an online digital slack monitor which is able to detect small timing deviations caused by IRFs in digital systems. The simulation results show that the proposed monitor is effective in detecting IRFs.

引用

页码：87 / 90

页数：4

共 50 条

[1] Intermittent Resistive Faults in Digital CMOS Circuits
Kerkhoff, Hans G.
Ebrahimi, H.
[J]. 2015 IEEE 18TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS (DDECS 2015), 2015, : 211 - 216
[2] Investigation of Intermittent Resistive Faults in Digital CMOS Circuits
Kerkhoff, Hans G.
Ebrahimi, Hassan
[J]. JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, 2016, 25 (03)
[3] TESTING FOR INTERMITTENT FAULTS IN DIGITAL CIRCUITS
BREUER, MA
[J]. IEEE TRANSACTIONS ON COMPUTERS, 1973, C 22 (03) : 241 - 246
[4] Testing for Intermittent Resistive Faults in CMOS Integrated Systems
Ebrahimi, Hassan
Kerkhoff, Hans G.
[J]. 19TH EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN (DSD 2016), 2016, : 703 - 707
[5] Detecting resistive shorts for CMOS domino circuits
Chang, JTY
McCluskey, EJ
[J]. INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS, 1998, : 890 - 899
[6] Detecting bridging faults in dynamic CMOS circuits
Chang, JTY
McCluskey, EJ
[J]. IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS, 1997, : 106 - 109
[7] Precise test generation for resistive bridging faults of CMOS combinational circuits
Maeda, T
Kinoshita, K
[J]. INTERNATIONAL TEST CONFERENCE 2000, PROCEEDINGS, 2000, : 510 - 519
[8] A PROBABILISTIC FAULT MODEL FOR ANALOG FAULTS IN DIGITAL CMOS CIRCUITS
FAVALLI, M
OLIVO, P
RICCO, B
[J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1992, 11 (11) : 1459 - 1462
[9] Resistive power in CMOS circuits
El-Moursy, MA
Friedman, EG
[J]. PROCEEDINGS OF THE 46TH IEEE INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS & SYSTEMS, VOLS 1-3, 2003, : 1455 - 1458
[10] Resistive power in CMOS circuits
El-Moursy, MA
Friedman, EG
[J]. ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2004, 41 (01) : 5 - 11

← 1 2 3 4 5 →