Relationship between heating atmosphere and copper foil impurities during graphene growth via low pressure chemical vapor deposition

被引:16
|
作者
Celik, Yasemin [1 ,2 ]
Escoffier, Walter [3 ]
Yang, Ming [3 ]
Flahaut, Emmanuel [2 ]
Suvaci, Ender [1 ]
机构
[1] Anadolu Univ, Dept Mat Sci & Engn, TR-26480 Eskisehir, Turkey
[2] Univ Toulouse 3 Paul Sabatier, CNRS, CIRIMAT, INPT,UMR CNRS UPS INP 5085, Bat CIRIMAT,118 Route Narbonne, F-31062 Toulouse 9, France
[3] Univ Toulouse, CNRS UPR 3228, INSA UPS, Lab Natl Champs Magnet Intenses, 143 Ave Rangueil, F-31400 Toulouse, France
关键词
SINGLE-CRYSTAL GRAPHENE; RAMAN-SPECTROSCOPY; HYDROGEN; PURIFICATION; MONOLAYER;
D O I
10.1016/j.carbon.2016.08.057
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Low-pressure chemical vapor deposition synthesis of graphene films on two different Cu foils, with different surface oxygen and carbon contents, was performed by controlling H-2 and/or Ar flow rates during heating. The influences of heating atmosphere on the final impurity level, quality of the synthesized graphene films and thickness uniformity were investigated depending on Cu foil impurities. Heating of carbon-rich, but oxygen-poor Cu foil in H-2 environment resulted in covering the foil surface by residual carbon which then acted as active sites for multilayer graphene growth. Ar-only flow was required during heating to promote high quality graphene growth on this foil. On carbon-poor, but oxygen-rich Cu foil high quality graphene growth was promoted when the heating was carried out under Ar/H-2 environment. Almost no carbon residues were observed on this foil even under H-2 only flow during heating. The heating atmosphere affected not only graphene growth, but also the type and amount of impurities formed on the surface. H-2 and Ar/H-2 heating resulted in the formation of spherical nanometer-sized impurities, while irregular-shaped, large (a few mu m) SiO2 impurities were observed when Ar alone was used during heating. Quality of the grown films was tested by Quantum Hall Effect measurements. (C) 2016 Elsevier Ltd. All rights reserved.
引用
收藏
页码:529 / 541
页数:13
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