Accelerated Validation of Product Life Under A Second-Tier Stress

Small sample size and long-life products' life assessment has become a hot research topic, since the reduction of sample size and shorten test time can not be achieved at the same time. Therefore, we provide a second-tier accelerated stress method to solve this problem in this paper. First, we combine the first-tier accelerated stress and the maximum entropy test method to cut down the sample size; second, use the second-tier accelerated stress to decrease the test time, and based on these two steps to design an accelerated validation plan. In this paper, we proposed a bogey test and maximum entropy based accelerated life test improvement program.