Displacement measurement in a Sagnac interferometer with thermal light second-order correlation

被引：2
|
作者：
Xu, De-Qin [1 ]
Dou, Ling-Yu [2 ]
Cao, De-Zhong [3 ]
Song, Xin-bing [2 ]
机构：
[1] Tianjin Univ Technol & Educ, Sch Sci, Tianjin 300222, Peoples R China
[2] Beijing Inst Technol, Sch Phys, Beijing 100081, Peoples R China
[3] Yantai Univ, Dept Phys, Yantai 264005, Peoples R China
来源：
APPLIED OPTICS | 2020年 / 59卷 / 18期
基金：
中国国家自然科学基金;
关键词：
INTERFERENCE;
D O I：
10.1364/AO.393599
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We report a displacement measurement experiment in second-order correlation and subwavelength correlation with thermal light. Our target is a single slit, which is inserted into a Sagnac interferometer to mimic a double-slit apparatus. According to the correlated diffraction pattern, we can predict the excursion of the slit from the optical axis. When the slit is shifted, we can predict the displacement accurately. We also present the mathematical presentations of beam propagation and reflection in comprehensive deduction. (C) 2020 Optical Society of America
引用
收藏
页码：5576 / 5580
页数：5
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