Analysis and modeling of resistive switching mechanisms oriented to resistive random-access memory

被引:6
|
作者
Huang Da [1 ,2 ]
Wu Jun-Jie [2 ]
Tang Yu-Hua [2 ]
机构
[1] Natl Univ Def Technol, State Key Lab High Performance Comp, Changsha 410073, Hunan, Peoples R China
[2] Natl Univ Def Technol, Sch Comp, Changsha 410073, Hunan, Peoples R China
基金
中国国家自然科学基金;
关键词
resistive random-access memory; resistive switching mechanism; circuit model; BIPOLAR;
D O I
10.1088/1674-1056/22/3/038401
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
With the progress of the semiconductor industry, the resistive random-access memory (RAM) has drawn increasing attention. The discovery of the memristor has brought much attention to this study. Research has focused on the resistive switching characteristics of different materials and the analysis of resistive switching mechanisms. We discuss the resistive switching mechanisms of different materials in this paper and analyze the differences of those mechanisms from the view point of circuitry to establish their respective circuit models. Finally, simulations are presented. We give the prospect of using different materials in resistive RAM on account of their resistive switching mechanisms, which are applied to explain their resistive switchings.
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页数:6
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